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Teaching & PhD Courses Advanced Solid State and Surface Characterization CH-633 State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM). Characterization of Materials 2025 MSE-716 This course introduces materials characterization techniques used by scientists and engineers. Lectures cover basic theory, applications, and limitations, while lab sessions offer hands-on experience, providing a well-rounded understanding of each method.
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Raffaella Buonsanti, Emad Oveisi, Mounir Driss Mensi, Valeria Mantella, Jianfeng Huang
Mohammad Khaja Nazeeruddin, Paul Joseph Dyson, Zhaofu Fei, Mounir Driss Mensi, Felix Daniel Bobbink, Cristina Roldán Carmona, Zhangjun Huang, Marius Franckevicius, Nikita Drigo