Improving Standard-Cell Design Flow using Factored Form Optimization

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The large subthreshold leakage current of static CMOS logic circuits designed in modern nanometer-scale technologies is one of the main barriers for implementing ultra-low power digital systems. Subthreshold source-coupled logic (STSCL) circuits are based ...

Fault-tolerant design methods for VLSI circuits, which have traditionally been addressed at system level, will not be adequate for future very-deep submicron CMOS devices where serious degradation of reliability is expected. Therefore, a new design approac ...

Improving Standard-Cell Design Flow using Factored Form Optimization

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