Sample preparation and direct observation techniques (optical microscopy, AFM, electron microscopy) and their practical application to the study of morphology and microdeformation in polymers. ...
The course starts from general discussion of the microscopy spatial resolution problem and different proposals to beat classical criteria in the field. Afterwards, modern scanning probe microscopy methods are discussed. ...
Modern Scanning Electron Microscopes, when combined with focused ion beams (Dual beam FIBs), provide a larger number of multi-modal imaging and different analytical methods. The course format consists of introductory lectures, lectures on advanced techniqu ...
Modern Scanning Electron Microscopes, when combined with Focused Ion Beams (Dual beam FIB-SEM), provide a larger number of multimodal imaging and analysis/characterisation modes at the nano- and micron-scales. The aim of the course is to present the extend ...
Lectures as well as hands-on trainings concerning different STEM imaging and spectroscopy techniques. Fundamentals of STEM, basic and advanced STEM imaging (ABF, ADF, iDPC, and 4D STEM), aberration-corrected STEM imaging and simulation, acquisition and ana ...