Publication

Observation and Modification of the Surface of Some Organic Crystals by Means of Atomic Force Microscopy

Giovanni Dietler, Gervais Chapuis, Dieter Schwarzenbach
2002
Journal Articles

Abstract

Crystals of hexamethylenetetramine (HMT) with aliphatic dicarboxylic acids in 1:1 molar ratio exhibit different behaviour depending on the number n of carbons in the aliphatic chain. For n=8 and 10, incommensurate phases have been observed, while for n=9, a commensurate disordered phase is found. The structure consists of alternating layers of roughly spherical HMT and acid chains. Atomic force microscope (AFM) has been used in order to characterise these layers in several different crystals. Images have been collected in contact and tapping modes. Contact mode images reveal that the tip interaction removed systematically an integer number of layers of the crystal. Morphological changes of the surface are observed in the images collected in tapping mode.

Official source

https://infoscience.epfl.ch/entities/publication/727be1f2-7121-4f46-a5bd-d8dea73ec59a

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Giovanni Dietler, Gervais Chapuis, Dieter Schwarzenbach
2002
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/727be1f2-7121-4f46-a5bd-d8dea73ec59a

About this result

Related concepts (32)

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Scanning tunneling microscope

A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.

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Observation and Modification of the Surface of Some Organic Crystals by Means of Atomic Force Microscopy

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