Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
This project focused on optimization of the deposition of platinum (Pt) thin films or use in piezoelectric MEMS/NEMS devices. Theory of piezoelectric, DC and DC-pulsed sputtering and thin film characterization was studied. Two parameters were varied in the deposition of the Pt thin films: gas flow and applied target power. Residual stress, resistivity and thickness were characterized. Aluminum nitride (AlN) deposited on top of the Pt thin films was characterized in terms of residual stress and rocking curves through x-ray diffraction (XRD). Initial results showed that as applied target decreased, deposition rate of Pt decreased, while the influence of Ar gas flow was immediately understood. Results of AlN deposited on Pt showed an improved rocking curve for lower Pt sputtering power and gas flow.