Person

David Fernando Reyes Vasquez

Expertise Electron energy loss spectroscopy (EELS)Aberration-corrected TEM and STEM Teaching & PhD Courses Scanning and Analytical Transmission Electron Microscopy MSE-735 This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.

Official source

https://people.epfl.ch/david.reyesvasquez?lang=en

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chat

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

David Fernando Reyes Vasquez

Chat with Graph Search

Development and characterization of N2O-plasma oxide layers for high-temperature p-type passivating contacts in silicon solar cells

Polycondensation as a Universal Method for Preparing High-density Single-atom Catalyst Libraries

Enhancing the Efficiency and Stability of Perovskite Solar Cells Using Chemical Bath Deposition of SnO2 Electron Transport Layers and 3D/2D Heterojunctions