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Expertise Electron energy loss spectroscopy (EELS)Aberration-corrected TEM and STEM Teaching & PhD Courses Scanning and Analytical Transmission Electron Microscopy MSE-735 This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.
Please note that this is not a complete list of this person’s publications. It includes only semantically relevant works. For a full list, please refer to Infoscience.
Christophe Ballif, Aïcha Hessler-Wyser, Franz-Josef Haug, Julien Hurni, Ezgi Genç, Sofia Libraro, Audrey Marie Isabelle Morisset, David Fernando Reyes Vasquez
Mounir Driss Mensi, Paul Joseph Dyson, Daniel Ortiz Trujillo, Pascal Miéville, Miyeon Chang, Xinbang Wu, Lindsey Eirika Kaelene Frederiksen, Xunhui Wang, Niccolò Martinolli, Laura Piveteau, Ariana Serban, Jaques-Christopher Schmidt, Timo Markus Oskar Felder, David Fernando Reyes Vasquez, Stefano Di Leone
Mohammad Khaja Nazeeruddin, Paul Joseph Dyson, Zhaofu Fei, Pascal Alexander Schouwink, Hiroyuki Kanda, Xiaoxin Gao, Liping Zhong, Shun Tian, David Fernando Reyes Vasquez, Yanyan Fang