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Lecture

Scanning Probe Microscopy: Techniques and Applications

Related lectures (32)

Scanning Probe Microscopy: Fundamentals

Covers the fundamentals of Scanning Probe Microscopy, including its history, principles, instruments, and applications in semiconductor research and industry.

Semiconductor Devices II: Defects Engineering

Covers the analysis of measurements and defects engineering in semiconductor devices, including density of states and defect probing.

Atomic Force Microscopy: Tip-Sample Interactions

Explores tip-sample interactions in AFM, covering hysteresis, contact and non-contact modes, feedback mechanisms, and image resolution.

Physics of Life: AFM

Explores Atomic Force Microscopy (AFM) principles, applications, and significance in scientific research, including biological structure studies.

Nanoscale MEMS: Fabrication, Tips, and Microscopy

Covers the fabrication of nanoscale MEMS devices and the operation of the Atomic Force Microscope for measuring ultrasmall forces on particles.

BioNanoArchitectonics: from atoms to medicine

Introduces BioNanoArchitectonics principles, from Particle Physics to smart materials and molecular control at the nanoscale.

Scanning probe microscopy: basics

Covers the basics of Scanning Probe Microscopy, focusing on STM and AFM, explaining principles, imaging techniques, and spectroscopy methods.

Nanoscale Properties: Surface Effects and Quantum Phenomena

Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.

Metal-Semiconductor Junction: Physics Overview

Provides an overview of metal-semiconductor junction physics, including work function, Schottky barrier, Ohmic contacts, and heterojunctions.

Scanning Probe Microscopy: Basics and Applications

Covers Scanning Probe Microscopy basics, tip fabrication, and nano-tip microfabrication for nanoscale imaging and manipulation.

Beam-Matter Interactions

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Piezo Scanner and STM

Explores piezo scanners, STM feedback, and challenges in achieving nanometer resolution for high-quality imaging.

Density of States in Semiconductor Devices

Explores density of states in semiconductor devices, covering electron gas, energy bands, Fermi-Dirac distribution, and band structures.

Surface Effects: Water, Tension, Capillary Force, Contact Angle

Explores water surface tension, capillary forces, and contact angles in detail.

Semiconductor Physics: Occupancy Statistics and Band Filling

Explores occupancy statistics and band filling in semiconductors, covering intrinsic and doped cases.

Semiconductor Physics: Donors and Acceptors

Covers the role of donors and acceptors in semiconductor physics and the control of conductivities.

Semiconductor Physics: Carrier Transport and Recombination

Explores semiconductor physics under high electric fields, discussing carrier transport, recombination processes, and the impact of injection.

Physics of p-n Junctions

Covers the physics of p-n junctions, including properties at thermal equilibrium, space charge region formation, and optical lithography.

Checking Probes-layer quality

Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Semiconductor Devices II: Contact Resistance Modeling

Explores contact resistance modeling in semiconductor devices, focusing on gate voltage calculation and defect analysis.