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Lecture

Test of VLSI Systems: Combinational and Sequential ATPG

In course

EE-530: Test of VLSI systems

Test of VLSI Systems covers theoretical knowledge related to the major algorithms used in VLSI test, and design for test techniques. Basic knowledge related to computer-aided design for test techniques, and their integration into a design-flow are presente ...

Description

This lecture covers the necessity and costs of testing VLSI systems, fault modeling, simulation, and test quality measurement. It delves into generating test vector patterns, structural vs. functional tests, scan design, search space abstractions, and the five values algebra. The computational burden of functionally and structurally testing a 64-bit adder is discussed, along with the Automatic Test-Pattern Generator (ATPG) algorithm, search space abstractions, and Roth's 5-valued algebra. Path sensitization methods, D-algorithm, backward and forward implications, fault cones, and D-frontiers are explained. The lecture concludes with examples of circuit path sensitization and the implementation of time-frame expansion for fault detection in sequential circuits.

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Instructor

Alexandre Schmid

Alexandre Schmid received the M.Sc. degree in microengineering and the Ph.D. degree in electrical engineering from the Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland, in 1994 and 2000, respectively. Since 1994, he has been with the EPFL, working with the Integrated Systems Laboratory as a Research and Teaching Assistant, and with the Electronics Laboratories as a Postdoctoral Fellow. In 2002, he was a Senior Research Associate with the Microelectronic Systems Laboratory, where he has been conducting research in the fields of bioelectronic interfaces and implantable biomedical electronics, nonconventional signal processing and neuromorphic hardware, and reliability of nanoelectronic devices, and also teaches with the Microengineering and Electrical Engineering Departments of EPFL. Since 2011, he is a Maître d'Enseignement et de Recherche (MER) Faculty Member with EPFL. He is a coauthor of two books, Reliability of Nanoscale Circuits and Systems, Methodologies and Circuit Architectures, Springer, 2011, and Wireless Cortical Implantable Systems, Springer, 2013, and a coeditor of one book, as well as over 100 articles published in journals and conferences. Dr. Schmid has served as the General Chair of the Fourth International Conference on Nano-Networks in 2009 and has been serving as an Associate Editor of the Institute of Electrical, Information, and Communication Engineers Electronics Express since 2009.

Official source

Ontological neighbourhood

Electrical engineering

Electronic engineering: Digital electronics

Related concepts (32)

Software testing

Software testing is the act of examining the artifacts and the behavior of the software under test by validation and verification. Software testing can also provide an objective, independent view of the software to allow the business to appreciate and understand the risks of software implementation. Test techniques include, but are not necessarily limited to: analyzing the product requirements for completeness and correctness in various contexts like industry perspective, business perspective, feasibility and viability of implementation, usability, performance, security, infrastructure considerations, etc.

Design for testing

Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment.

Sequential logic

In automata theory, sequential logic is a type of logic circuit whose output depends on the present value of its input signals and on the sequence of past inputs, the input history. This is in contrast to combinational logic, whose output is a function of only the present input. That is, sequential logic has state (memory) while combinational logic does not. Sequential logic is used to construct finite-state machines, a basic building block in all digital circuitry.

Combinational logic

In automata theory, combinational logic (also referred to as time-independent logic or combinatorial logic ) is a type of digital logic which is implemented by Boolean circuits, where the output is a pure function of the present input only. This is in contrast to sequential logic, in which the output depends not only on the present input but also on the history of the input. In other words, sequential logic has memory while combinational logic does not.

Asynchronous circuit

Asynchronous circuit (clockless or self-timed circuit) is a sequential digital logic circuit that does not use a global clock circuit or signal generator to synchronize its components. Instead, the components are driven by a handshaking circuit which indicates a completion of a set of instructions. Handshaking works by simple data transfer protocols. Many synchronous circuits were developed in early 1950s as part of bigger asynchronous systems (e.g. ORDVAC).

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