Software testingSoftware testing is the act of examining the artifacts and the behavior of the software under test by validation and verification. Software testing can also provide an objective, independent view of the software to allow the business to appreciate and understand the risks of software implementation. Test techniques include, but are not necessarily limited to: analyzing the product requirements for completeness and correctness in various contexts like industry perspective, business perspective, feasibility and viability of implementation, usability, performance, security, infrastructure considerations, etc.
Design for testingDesign for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment.
Sequential logicIn automata theory, sequential logic is a type of logic circuit whose output depends on the present value of its input signals and on the sequence of past inputs, the input history. This is in contrast to combinational logic, whose output is a function of only the present input. That is, sequential logic has state (memory) while combinational logic does not. Sequential logic is used to construct finite-state machines, a basic building block in all digital circuitry.
Combinational logicIn automata theory, combinational logic (also referred to as time-independent logic or combinatorial logic ) is a type of digital logic which is implemented by Boolean circuits, where the output is a pure function of the present input only. This is in contrast to sequential logic, in which the output depends not only on the present input but also on the history of the input. In other words, sequential logic has memory while combinational logic does not.
Asynchronous circuitAsynchronous circuit (clockless or self-timed circuit) is a sequential digital logic circuit that does not use a global clock circuit or signal generator to synchronize its components. Instead, the components are driven by a handshaking circuit which indicates a completion of a set of instructions. Handshaking works by simple data transfer protocols. Many synchronous circuits were developed in early 1950s as part of bigger asynchronous systems (e.g. ORDVAC).
Acceptance testingIn engineering and its various subdisciplines, acceptance testing is a test conducted to determine if the requirements of a specification or contract are met. It may involve chemical tests, physical tests, or performance tests. In systems engineering, it may involve black-box testing performed on a system (for example: a piece of software, lots of manufactured mechanical parts, or batches of chemical products) prior to its delivery.
Boolean circuitIn computational complexity theory and circuit complexity, a Boolean circuit is a mathematical model for combinational digital logic circuits. A formal language can be decided by a family of Boolean circuits, one circuit for each possible input length. Boolean circuits are defined in terms of the logic gates they contain. For example, a circuit might contain binary AND and OR gates and unary NOT gates, or be entirely described by binary NAND gates. Each gate corresponds to some Boolean function that takes a fixed number of bits as input and outputs a single bit.
Signal generatorA signal generator is one of a class of electronic devices that generates electrical signals with set properties of amplitude, frequency, and wave shape. These generated signals are used as a stimulus for electronic measurements, typically used in designing, testing, troubleshooting, and repairing electronic or electroacoustic devices, though it often has artistic uses as well. There are many different types of signal generators with different purposes and applications and at varying levels of expense.
System testingSystem testing is testing conducted on a complete integrated system to evaluate the system's compliance with its specified requirements. System testing takes, as its input, all of the integrated components that have passed integration testing. The purpose of integration testing is to detect any inconsistencies between the units that are integrated together (called assemblages). System testing seeks to detect defects both within the "inter-assemblages" and also within the system as a whole.
Regression testingRegression testing (rarely, non-regression testing) is re-running functional and non-functional tests to ensure that previously developed and tested software still performs as expected after a change. If not, that would be called a regression. Changes that may require regression testing include bug fixes, software enhancements, changes, and even substitution of electronic components (hardware). As regression test suites tend to grow with each found defect, test automation is frequently involved.
Boolean algebraIn mathematics and mathematical logic, Boolean algebra is a branch of algebra. It differs from elementary algebra in two ways. First, the values of the variables are the truth values true and false, usually denoted 1 and 0, whereas in elementary algebra the values of the variables are numbers. Second, Boolean algebra uses logical operators such as conjunction (and) denoted as ∧, disjunction (or) denoted as ∨, and the negation (not) denoted as ¬.
Integration testingIntegration testing (sometimes called integration and testing, abbreviated I&T) is the phase in software testing in which the whole software module is tested or if it consists of multiple software modules they are combined and then tested as a group. Integration testing is conducted to evaluate the compliance of a system or component with specified functional requirements. It occurs after unit testing and before system testing.
Synchronous circuitIn digital electronics, a synchronous circuit is a digital circuit in which the changes in the state of memory elements are synchronized by a clock signal. In a sequential digital logic circuit, data are stored in memory devices called flip-flops or latches. The output of a flip-flop is constant until a pulse is applied to its "clock" input, upon which the input of the flip-flop is latched into its output. In a synchronous logic circuit, an electronic oscillator called the clock generates a string (sequence) of pulses, the "clock signal".
API testingAPI testing is a type of software testing that involves testing application programming interfaces (APIs) directly and as part of integration testing to determine if they meet expectations for functionality, reliability, performance, and security. Since APIs lack a GUI, API testing is performed at the message layer. API testing is now considered critical for automating testing because APIs now serve as the primary interface to application logic and because GUI tests are difficult to maintain with the short release cycles and frequent changes commonly used with Agile software development and DevOps.
XOR gateXOR gate (sometimes EOR, or EXOR and pronounced as Exclusive OR) is a digital logic gate that gives a true (1 or HIGH) output when the number of true inputs is odd. An XOR gate implements an exclusive or () from mathematical logic; that is, a true output results if one, and only one, of the inputs to the gate is true. If both inputs are false (0/LOW) or both are true, a false output results. XOR represents the inequality function, i.e., the output is true if the inputs are not alike otherwise the output is false.
Arbitrary waveform generatorAn arbitrary waveform generator (AWG) is a piece of electronic test equipment used to generate electrical waveforms. These waveforms can be either repetitive or single-shot (once only) in which case some kind of triggering source is required (internal or external). The resulting waveforms can be injected into a device under test and analyzed as they progress through it, confirming the proper operation of the device or pinpointing a fault in it. Unlike function generators, AWGs can generate any arbitrarily defined waveshape as their output.
OR gateThe OR gate is a digital logic gate that implements logical disjunction. The OR gate returns true if any of its inputs are true; otherwise it returns false. The input and output states are normally represented by different voltage levels. Any OR gate can be constructed with two or more inputs. It outputs a 1 if any of these inputs are 1, or outputs a 0 only if all inputs are 0. The inputs and outputs are binary digits ("bits") which have two possible logical states.
Boundary scanBoundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit. The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized in 1990 as the IEEE Std. 1149.1-1990.
Digital electronicsDigital electronics is a field of electronics involving the study of digital signals and the engineering of devices that use or produce them. This is in contrast to analog electronics and analog signals. Digital electronic circuits are usually made from large assemblies of logic gates, often packaged in integrated circuits. Complex devices may have simple electronic representations of Boolean logic functions. The binary number system was refined by Gottfried Wilhelm Leibniz (published in 1705) and he also established that by using the binary system, the principles of arithmetic and logic could be joined.
AND gateThe AND gate is a basic digital logic gate that implements logical conjunction (∧) from mathematical logic - AND gate behaves according to the truth table. A HIGH output (1) results only if all the inputs to the AND gate are HIGH (1). If not all inputs to the AND gate are HIGH, LOW output results. The function can be extended to any number of inputs. There are three symbols for AND gates: the American (ANSI or 'military') symbol and the IEC ('European' or 'rectangular') symbol, as well as the deprecated DIN symbol.
