Mediaspace scheduled maintenance: Aug 25, 2026 07:00 - 12:00 AM. During this time, videos will be temporarily unavailable. Check status updates.

Lecture

Test of VLSI Systems: BIST and Response Compaction

In course

EE-530: Test of VLSI systems

Test of VLSI Systems covers theoretical knowledge related to the major algorithms used in VLSI test, and design for test techniques. Basic knowledge related to computer-aided design for test techniques, and their integration into a design-flow are presente ...

Description

This lecture covers the principles of Built-In Self-Test (BIST) techniques and Response Compaction in VLSI systems. It explains the use of Linear Feedback Shift Registers (LFSRs) for generating pseudo-random sequences and the benefits and drawbacks of BIST. The lecture also delves into Response Compaction techniques like One's Count Compactor, Transition Count Compactor, and Parity Checking. It discusses the implementation of Multiple Input Signature Register (MISR) and Built-In Logic Block Observer (BILBO) for efficient response analysis. The lecture concludes with a discussion on test points and their impact on fault coverage in VLSI testing.

This video is available exclusively on Mediaspace for a restricted audience. Please log in to MediaSpace to access it if you have the necessary permissions.

Watch on Mediaspace

Instructor

Alexandre Schmid

Alexandre Schmid received the M.Sc. degree in microengineering and the Ph.D. degree in electrical engineering from the Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland, in 1994 and 2000, respectively. Since 1994, he has been with the EPFL, working with the Integrated Systems Laboratory as a Research and Teaching Assistant, and with the Electronics Laboratories as a Postdoctoral Fellow. In 2002, he was a Senior Research Associate with the Microelectronic Systems Laboratory, where he has been conducting research in the fields of bioelectronic interfaces and implantable biomedical electronics, nonconventional signal processing and neuromorphic hardware, and reliability of nanoelectronic devices, and also teaches with the Microengineering and Electrical Engineering Departments of EPFL. Since 2011, he is a Maître d'Enseignement et de Recherche (MER) Faculty Member with EPFL. He is a coauthor of two books, Reliability of Nanoscale Circuits and Systems, Methodologies and Circuit Architectures, Springer, 2011, and Wireless Cortical Implantable Systems, Springer, 2013, and a coeditor of one book, as well as over 100 articles published in journals and conferences. Dr. Schmid has served as the General Chair of the Fourth International Conference on Nano-Networks in 2009 and has been serving as an Associate Editor of the Institute of Electrical, Information, and Communication Engineers Electronics Express since 2009.

Official source

Related concepts (32)

Linear-feedback shift register

In computing, a linear-feedback shift register (LFSR) is a shift register whose input bit is a linear function of its previous state. The most commonly used linear function of single bits is exclusive-or (XOR). Thus, an LFSR is most often a shift register whose input bit is driven by the XOR of some bits of the overall shift register value. The initial value of the LFSR is called the seed, and because the operation of the register is deterministic, the stream of values produced by the register is completely determined by its current (or previous) state.

Maximum length sequence

A maximum length sequence (MLS) is a type of pseudorandom binary sequence. They are bit sequences generated using maximal linear-feedback shift registers and are so called because they are periodic and reproduce every binary sequence (except the zero vector) that can be represented by the shift registers (i.e., for length-m registers they produce a sequence of length 2m − 1). An MLS is also sometimes called an n-sequence or an m-sequence. MLSs are spectrally flat, with the exception of a near-zero DC term.

Pseudorandom binary sequence

A pseudorandom binary sequence (PRBS), pseudorandom binary code or pseudorandom bitstream is a binary sequence that, while generated with a deterministic algorithm, is difficult to predict and exhibits statistical behavior similar to a truly random sequence. PRBS generators are used in telecommunication, such as in analog-to-information conversion, but also in encryption, simulation, correlation technique and time-of-flight spectroscopy. The most common example is the maximum length sequence generated by a (maximal) linear feedback shift register (LFSR).

Xorshift

Xorshift random number generators, also called shift-register generators, are a class of pseudorandom number generators that were invented by George Marsaglia. They are a subset of linear-feedback shift registers (LFSRs) which allow a particularly efficient implementation in software without the excessive use of sparse polynomials. They generate the next number in their sequence by repeatedly taking the exclusive or of a number with a bit-shifted version of itself.

Very Large Scale Integration

Very large-scale integration (VLSI) is the process of creating an integrated circuit (IC) by combining millions or billions of MOS transistors onto a single chip. VLSI began in the 1970s when MOS integrated circuit (Metal Oxide Semiconductor) chips were developed and then widely adopted, enabling complex semiconductor and telecommunication technologies. The microprocessor and memory chips are VLSI devices. Before the introduction of VLSI technology, most ICs had a limited set of functions they could perform.

Related lectures (27)

Stream Ciphers: Buteforce Inversion Algorithms

Explores stream ciphers, buteforce inversion algorithms, key recovery games, and attacks in cryptography.

Probability and Statistics

Covers fundamental concepts in probability and statistics, emphasizing data analysis techniques and statistical modeling.

Conditional Probability: Prediction Decomposition

Explores conditional probability, Bayes' theorem, and prediction decomposition for informed decision-making.

Dependence and Correlation

Explores dependence, correlation, and conditional expectations in probability and statistics, highlighting their significance and limitations.

Quantum Mechanics: Probability and Measurement