Lecture

Solid State Characterization

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In course

CH-633: Advanced Solid State and Surface Characterization

State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and ...

Description

This lecture covers the basic concepts of state-of-the-art methods for solid state characterization, including X-ray scattering methods, electron microscopy, and surface spectroscopy. Students will learn about long range vs. short range order, resolution of experiments, bulk vs. surface properties, and more. The course emphasizes the importance of choosing the appropriate method for different materials and understanding the physico-chemical properties of different types of solids. Topics include crystal structures, molecular solids, ionic solids, covalent solids, and metallic solids. The lecture also delves into defects in real solids and the reciprocal lattice in crystallography.

Instructors (3)

Mounir Driss Mensi

Teaching & PhD Courses Advanced Solid State and Surface Characterization CH-633 State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM). Characterization of Materials 2025 MSE-716 This course introduces materials characterization techni

Emad Oveisi

Dr Emad Oveisi is a senior scientist at the Interdisciplinary Centre for Electron Microscopy (CIME), EPFL. Emad received a BSc in Metallurgy and Materials Engineering (2005) and an MSc in Materials Science (2008) both from the University of Tehran (Iran). He graduated with a PhD in Materials Science and Engineering at EPFL in 2014 for a thesis on the "Three-Dimensional STEM Imaging of Dislocations" under the direction of Prof. Cécile Hébert. The PhD thesis at the Electron Spectrometry and Microscopy Laboratory (LSME), served as an introduction to many of the advanced microscopy techniques that have proven to be a platform for his research career. A post-doctoral research at the centre for electron microscopy gave him the opportunity to peruse a cutting-edge research on one of the most modern aberration-corrected transmission electron microscopes.Since the inauguration of the Energypolis campus of EPFL in Sion, he has been the manager and reference scientist of the electron microscopy platform of EPFL-Valais, working with 9 research groups and more than 200 researchers. In addition to this core responsibility, he provides advanced microscopy consulting and service to EPFL scientists and assist their research to the highest level possible. Emad Oveisi’s research focuses on the application and development of novel electron microscopy techniques, with emphasis on 3D imaging of crystal defects, as well as the precision measurement of materials properties using aberration-corrected S/TEM. In 2018, he received the prestigious Microscopy Innovation Award for inventing “Single-shot three-dimensional electron imaging”, a novel technique that enables 3D imaging of in situ dynamics. In 2016 Emad was elected as an interim representative for the scientific staff ("corps intermédiaire") to the Council of the Institute of Chemistry (ISIC). Since 2019, he is a member of EPFL Teachers’ Council (CCE) and has been elected as one of its four bureau members. This role allows him to be exposed to new ideas and pedagogical challenges, as well being involved in discussions with the Vice Presidency of Education (VPE) and other teaching organisations for defining teaching strategies at the EPFL.

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Geology: Mineralogy

Related concepts (32)

X-ray crystallography

X-ray crystallography is the experimental science determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the density of electrons within the crystal. From this electron density, the mean positions of the atoms in the crystal can be determined, as well as their chemical bonds, their crystallographic disorder, and various other information.

Crystal structure

In crystallography, crystal structure is a description of the ordered arrangement of atoms, ions, or molecules in a crystalline material. Ordered structures occur from the intrinsic nature of the constituent particles to form symmetric patterns that repeat along the principal directions of three-dimensional space in matter. The smallest group of particles in the material that constitutes this repeating pattern is the unit cell of the structure.

Molecular solid

A molecular solid is a solid consisting of discrete molecules. The cohesive forces that bind the molecules together are van der Waals forces, dipole-dipole interactions, quadrupole interactions, π-π interactions, hydrogen bonding, halogen bonding, London dispersion forces, and in some molecular solids, coulombic interactions. Van der Waals, dipole interactions, quadrupole interactions, π-π interactions, hydrogen bonding, and halogen bonding (2-127 kJ mol−1) are typically much weaker than the forces holding together other solids: metallic (metallic bonding, 400-500 kJ mol−1), ionic (Coulomb’s forces, 700-900 kJ mol−1), and network solids (covalent bonds, 150-900 kJ mol−1).

Solid-state physics

Solid-state physics is the study of rigid matter, or solids, through methods such as solid-state chemistry, quantum mechanics, crystallography, electromagnetism, and metallurgy. It is the largest branch of condensed matter physics. Solid-state physics studies how the large-scale properties of solid materials result from their atomic-scale properties. Thus, solid-state physics forms a theoretical basis of materials science. Along with solid-state chemistry, it also has direct applications in the technology of transistors and semiconductors.

Raman spectroscopy

Raman spectroscopy (ˈrɑːmən) (named after Indian physicist C. V. Raman) is a spectroscopic technique typically used to determine vibrational modes of molecules, although rotational and other low-frequency modes of systems may also be observed. Raman spectroscopy is commonly used in chemistry to provide a structural fingerprint by which molecules can be identified. Raman spectroscopy relies upon inelastic scattering of photons, known as Raman scattering.

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