Covers the fundamentals of Scanning Probe Microscopy, including its history, principles, instruments, and applications in semiconductor research and industry.
Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.
Explains the operation of the Atomic Force Microscope for imaging insulating surfaces and discusses the differences with the Magnetic Force Microscope.
Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.
Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.
