Covers high-resolution transmission electron microscopy imaging techniques, focusing on phase contrast, simulations, and the impact of aberrations on image interpretation.
Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.
Explores the principles and applications of Focused Ion Beam technology, covering imaging, milling, TEM sample preparation, nanofabricated structures, and 3D microscopy.
Delves into advancements in optical imaging, overcoming diffraction limits, and imaging through complex media, with a focus on biological applications.
Explores crystal structure determination using 3D electron diffraction and its applications in nanocrystallography, emphasizing challenges and advancements.