Lecture

Transmission Electron Microscopy: Imaging and Diffraction

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In course

MSE-450: Electron microscopy: advanced methods

With this course, the student will learn about advanced methods in transmission electron microscopy, especially what is the electron optical setup involved in the acquisition, and how to interpret the data. After the course, students will be able to unders ...

Description

This lecture covers the operation of a Transmission Electron Microscope (TEM), focusing on accessing different imaging modes and understanding the effects on lenses. The slides detail the setup, camera settings, apertures, and integration times used in TEM imaging and diffraction. The instructor demonstrates how to adjust focus, spot size, and exposure time, providing a comprehensive overview of TEM operation.

In MOOC

Transmission Electron Microscopy for Materials Sciences

This course provides a comprehensive introduction to transmission electron microscopy (TEM) in the field of materials science. For an instrument operated by a single user, modern TEM provides an analytical platform with unsurpassed versatility, giving access to structural and chemical information from the micrometer to the sub-angstrom scale. In a thin, electron-transparent sample one can measure the crystallinity, grain structure, size, and defects, and the chemical composition. The crystal lattice can be

Instructors (2)

Cécile Hébert

Cécile Hébert was born in France in 1970. She obtained her Ingeneer degree (physics) and her PhD degree (design of a new energy filter for transmission electron microscopy, under the direction of Prof. B. Jouffrey) at the Ecole Centrale in Paris. As a post doc with Prof. P. Schattschneider, she was working on the calculation of the fine structure of ionisation edges in EELS. As a research assistant at the Vienna University of Technology, she was one of the main participant to the CHIRALTEM project dealing with the measurement of magnetic circular dichroism in the electron microscope.

Duncan Thomas Lindsay Alexander

Duncan Alexander graduated with a PhD in Materials Science and Metallurgy at the University of Cambridge in 2003 for a thesis on the kinetics of metallurgical phase transformations under the direction of Lindsay Greer. From 2003 to 2007 he held a Royal Society Overseas Research Fellowship at the University of Sydney, and then post-doctoral positions at the University of Cambridge and Arizona State University, working first on materials electrochemistry with Carsten Schwandt and Derek Fray, and then the characterization of atmospheric aerosol particles with Peter Crozier and Jim Anderson. In 2007 he came to EPFL as a scientific collaborator in the group of László Forró, and from 2008 to 2017 he was a staff scientist at EPFL’s Interdisciplinary Centre for Electron Microscopy (CIME), specializing in the application of advanced transmission electron microscopy techniques and enabling electron microscopy research activities for groups across EPFL through teaching, training and support. In 2018 he joined the Electron Spectrometry and Microscopy Laboratory (LSME) as a full-time research scientist dedicated to advancing transmission electron microscopy techniques, and was promoted to the status of Research and Teaching Associate. In 2019, together with LSME director Cécile Hébert, he launched the first MOOC on transmission electron microscopy for materials science: https://www.coursera.org/learn/microscopy/For a complete list of peer-reviewed publications, see:https://orcid.org/0000-0003-4350-8587

Official source

Related concepts (32)

Fraunhofer diffraction

In optics, the Fraunhofer diffraction equation is used to model the diffraction of waves when plane waves are incident on a diffracting object, and the diffraction pattern is viewed at a sufficiently long distance (a distance satisfying Fraunhofer condition) from the object (in the far-field region), and also when it is viewed at the focal plane of an imaging lens. In contrast, the diffraction pattern created near the diffracting object and (in the near field region) is given by the Fresnel diffraction equation.

Fresnel diffraction

In optics, the Fresnel diffraction equation for near-field diffraction is an approximation of the Kirchhoff–Fresnel diffraction that can be applied to the propagation of waves in the near field. It is used to calculate the diffraction pattern created by waves passing through an aperture or around an object, when viewed from relatively close to the object. In contrast the diffraction pattern in the far field region is given by the Fraunhofer diffraction equation. The near field can be specified by the Fresnel number, F, of the optical arrangement.

Camera phone

A camera phone is a mobile phone which is able to capture photographs and often record video using one or more built-in digital cameras. It can also send the resulting image wirelessly and conveniently. The first commercial phone with color camera was the Kyocera Visual Phone VP-210, released in Japan in May 1999. Most camera phones are smaller and simpler than the separate digital cameras. In the smartphone era, the steady sales increase of camera phones caused point-and-shoot camera sales to peak about 2010 and decline thereafter.

Scanning transmission electron microscopy

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Related lectures (36)

Transmission Electron Microscopy: Advanced Techniques MOOC: Transmission Electron Microscopy for Materials Sciences

Explores advanced techniques in transmission electron microscopy, focusing on phase contrast imaging and camera settings.

Electron Microscopy: TEM

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

Electron Microscopy Components

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Diffraction: Theory and Formulas

Covers the theory and formulas of diffraction, including Fresnel and Fraunhofer diffraction, integral theorems, and geometric methods.

Transmission Electron Microscopy