Explores the qualitative analysis of X-ray diffraction patterns for cementitious materials, focusing on identifying crystalline phases based on characteristic peak patterns.
Explores applications of micron and submicron focusing, crystallography, and tomographic reconstructions in beamlines, as well as the need for secondary optics and different types of lenses.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.