Explores the operation and analysis of a scanning electron microscope, covering SEM controls, detectors, image acquisition, spectra analysis, and software usage.
Introduces EBSD and ESEM, covering acquisition, sample preparation, indexing, applications, and data analysis, along with the operation and benefits of ESEM.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores Environmental Scanning Electron Microscopy (ESEM) for imaging diverse samples without preparation, covering electron beam scanning, pressure manipulation, electron scattering, X-ray analysis, and phase transitions.