Caracterization and reliability of thin dielectrics and MOSFETs

Serguei Okhonin
2002
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Serguei Okhonin
2002
Theses

Source officielle

Publications associées (20)

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https://infoscience.epfl.ch/entities/publication/4d02c2e4-0db6-45c8-9df5-6d28b2985dc5

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