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Tobias Bandi

Cette personne a quitté l’EPFL

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Publications associées (4)

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Reliability Aspects of Microelectromechanical Systems for Space Applications : Mechanical Properties of Structural Materials and Analysis of Packaging Strains

Tobias Bandi

Microelectromechanical systems (MEMS) are an essential ingredient in many technological innovations and a source of game-changing inventions in the automotive industry, space exploration, consumer electronics and medical applications due to its capability ...

EPFL2014

Proton-Radiation Tolerance of Silicon and SU-8 as Structural Materials for High-Reliability MEMS

Herbert Shea, Antonia Neels, Alex Dommann, Tobias Bandi

The susceptibility of single-crystal silicon and SU-8 resonators to proton-radiation induced degradation was investigated. Both materials are in widespread use for microsystems structures, thus the stability of the mechanical properties must be ensured ove ...

Institute of Electrical and Electronics Engineers2013

Where is the limit? Yield strength improvement in silicon micro-structures by surface treatments

Antonia Neels, Alex Dommann, Tobias Bandi

Imperfections, like surface roughness and defects, introduced by common manufacturing processes are recognized to favor failure of microfabricated components and systems. Up to now only a reduced part of the ideal strength prediction by zero Kelvin quantum ...

Wiley-VCH Verlag2016

Multi-scale and multi-energy non-destructive X-ray analysis of the European Retrievable Carrier (EURECA)

Grégoire Gabriel Germain Bourban, Volker Gass, Tobias Bandi

The reduction in costs for space travel and scientific experiments in microgravity raises the question of equipment reusability. This goal can only be achieved if the space travel associated system degradations are fully understood. Non-destructive analysi ...

2025