Myun Sik Kim

Cette personne n’est plus à l’EPFL

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Publications associées (50)

Photonic Nanojet engineering: Focal point shaping with scattering phenomena of dielectric microspheres

Hans Peter Herzig, Myun Sik Kim, Toralf Scharf

We experimentally engineer Nanojets produced by dielectric spheres by varying the illumination and observe the effect with a high-resolution interference microscope (HRIM). Converging and diverging spherical wavefronts and Bessel- Gauss beams are considere ...

SPIE2011

Measuring amplitude and phase of light emerging from microstructures with HRIM

Hans Peter Herzig, Myun Sik Kim, Toralf Scharf

Ultra high-resolution measurements of amplitude and phase fields emerging from fine period amplitude gratings are presented and discussed. In the axial direction periodically repeated features are found, whose origins are the Talbot effect within the Fresn ...

SPIE Digital Library2011

Measurements of light fields emerging from fine amplitude gratings

Hans Peter Herzig, Myun Sik Kim, Toralf Scharf

High resolution amplitude and phase of light fields emerging from a 2-μm-period amplitude grating are measured for different wavelengths. The amplitude gratings lead to highly periodic patterns caused by the Talbot effect. Such patterns reach periodicities ...

2010

Small-size microlens characterization by multiwavelength high-resolution interference microscopy

Hans Peter Herzig, Myun Sik Kim, Toralf Scharf

Microlenses are widely studied in two main areas: fabrication and characterization. Nowadays, characterization draws more attention because it is difficult to apply test techniques to microlenses that are used for conventional optical systems. Especially, ...

Optical Society of America2010

Amplitude and Phase Fields of Photonic Nanojets

Hans Peter Herzig, Myun Sik Kim, Toralf Scharf

We report on advanced 3D direct imaging of light fields emerging from a photonic nanojet. We used an interference microscope that allows observation of amplitude and phase at the highest resolution. For the first time cross polarization interferometry is u ...

2010

Multiwavelength High Resolution Interference Microscopy (HRIM) for the characterization of small size microlenes

Myun Sik Kim

Introduction Definitions of microlens and Challenges for small size 2. High Resolution Interference Microscope (HRIM) System and Upgraded features 5 frame phase shift algorithm 3. Principle of characterization of microlenses Standard tests Unconventiona ...

2010

Fabrication and Characterization of 1-D diffusing elements

Hans Peter Herzig, Roland Andreas Bitterli, Myun Sik Kim, Toralf Scharf

Certain high power laser applications require thin homogeneous laser lines. In this paper we describe the concept, fabrication and characterization of a 1-D diffuser that generates such a line. The device is based on an array of concave cylinder lenses wit ...

2009

High Resolution Interference Microscopy: 3D measurement of focused light at 405nm applied to optical disc

Hans Peter Herzig, Myun Sik Kim, Toralf Scharf

High capacity data storage on DVD and optical discs is based on focused light beams. The characterization of light fields within the focus point is a very difficult task, which requires a high-resolution method like scanning near field optical microscopy ( ...

2009

Refractive statistical concave 1D diffusers for laser beam shaping

Hans Peter Herzig, Roland Andreas Bitterli, Myun Sik Kim, Toralf Scharf

2008

Interferometric Measurement on a Nanometric Length Scale

Hans Peter Herzig, Myun Sik Kim, Toralf Scharf

We investigate a measurement technique based on High Resolution Interference Microscopy (HRIM). HRIM allows the characterization of amplitude and phase of electromagnetic wave-fields in the far-field with a spatial accuracy that corresponds to a few nanome ...

2008

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