Cours enseignés par Marco Cantoni

MSE-352: Introduction à la microscopie + TP

Ce cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux microscopies électronique et optique. Le cours comprend d ...

MSE-637(b): Transmission electron microscopy and diffraction (b)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, s ...

MSE-704: 3D Electron Microscopy and FIB-Nanotomography

The principles of 3D surface (SEM) reconstruction and its limitations will be explained. 3D volume reconstruction and tomography methods by electron microscopy (SEM/FIB and TEM) will be explained and compared with x-ray tomography. ...

MSE-637(a): Transmission electron microscopy and diffraction (a)

This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, s ...

MSE-636(a): Scanning electron microscopy techniques (a)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications. ...

MSE-636(b): Scanning electron microscopy techniques (b)

This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their research or who want to understand how to interpret SEM images and analytical results presented in scientific publications. ...

MSE-735: Scanning and Analytical Transmission Electron Microscopy

This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who h ...