Mediaspace scheduled maintenance: Aug 25, 2026 07:00 - 12:00 AM. During this time, videos will be temporarily unavailable. Check status updates.

Concept

Mesure faible

Publications associées (25)

Measurement-system design for structural identification

Numa Joy Bertola

In developed countries, the management of existing civil infrastructure is challenging due to evolving functional requirements, aging and climate change. Due to conservative approaches in construction design and practice, infrastructure often has hidden re ...

EPFL2020

Optical backaction-evading measurement of a mechanical oscillator

Tobias Kippenberg, Liu Qiu, Itay Shomroni

Quantum mechanics imposes a limit on the precision of a continuous position measurement of a harmonic oscillator, due to backaction arising from quantum fluctuations in the measurement field. This standard quantum limit can be surpassed by monitoring only ...

Springer2019

High-fidelity optical diffraction tomography of multiple scattering samples

Demetri Psaltis, Joowon Lim

We propose an iterative reconstruction scheme for optical diffraction tomography that exploits the split-step nonparaxial (SSNP) method as the forward model in a learning tomography scheme. Compared with the beam propagation method (BPM) previously used in ...

Springer2019

Fourier dimensionality reduction for fast radio transients

Jean-Philippe Thiran, Yves Wiaux, Vijay Kartik, Ming Jiang

In the context of next-generation radio interferometers, we are facing a big challenge of how to economically process data. The classical dimensionality reduction technique, averaging visibilities on time, may dilute fast radio transients (FRT). We propose ...

2019

Correction of surface error occurring in microlenses characterization performed by optical profilers

Toralf Scharf, Wilfried Noell, Jeremy Béguelin

Characterizing the surface of microlenses by optical profilers has the important advantages of measurement speed, flexibility and automation. Nevertheless, the accuracy of such characterization is limited by error occurring in non-flat measurements. Here, ...

SPIE-INT SOC OPTICAL ENGINEERING2019