Publication

Progress in understanding VUV photoemission in low-dimensionality systems

Giorgio Margaritondo, Helmuth Berger
1996
Journal Articles

Abstract

High-resolution angle-resolved photoemission and core-level photoemission measurements were performed on single crystal samples of the quasi-one-dimensional material (TaSe4)(2)I and the cuprate superconductor Bi2Sr2CaCu2O8+x. Resistivity measurements were performed on both materials. X-ray diffraction, transmission electron microscopy (TEM), and AC susceptibility measurements were performed on the cuprate samples. The data indicate that photoemission studies provide key information in understanding the physics issues of both materials.

Official source

https://infoscience.epfl.ch/entities/publication/ff2528ef-7fd1-4a5d-931a-30152af50863

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Giorgio Margaritondo, Helmuth Berger
1996
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/ff2528ef-7fd1-4a5d-931a-30152af50863

About this result

Related concepts (32)

Photoemission spectroscopy

Photoemission spectroscopy (PES), also known as photoelectron spectroscopy, refers to energy measurement of electrons emitted from solids, gases or liquids by the photoelectric effect, in order to determine the binding energies of electrons in the substance. The term refers to various techniques, depending on whether the ionization energy is provided by X-ray, XUV or UV photons. Regardless of the incident photon beam, however, all photoelectron spectroscopy revolves around the general theme of surface analysis by measuring the ejected electrons.

X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Related publications (4)

Progress in understanding VUV photoemission in low-dimensionality systems

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