Publication

Photoemission Response of Bi2sr2cacu2ox - the Normal-State Anisotropy Is Intrinsic

Giorgio Margaritondo, Helmuth Berger
1993
Journal Articles

Abstract

Angle-resolved, synchrotron-radiation photoemission and low-energy electron-diffraction studies of single-crystal Bi2Sr2CaCu2Ox high-temperature superconductors establish that the [100] and [010] directions exhibit quantitatively different structural and electronic properties. Specifically, there is a superlattice modulation in the [010] direction, with superlattice period between 4.7 and 5.2 times the period in the [100] direction. Accompanying this structural difference there is a marked difference in the intensity and amount of dispersion in the two directions.

Official source

https://infoscience.epfl.ch/entities/publication/fc702f1f-2475-436a-af8c-29965b1f2f5a

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Giorgio Margaritondo, Helmuth Berger
1993
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/fc702f1f-2475-436a-af8c-29965b1f2f5a

About this result

Related concepts (12)

Electron diffraction

Electron diffraction refers to changes in the direction of electron beams due to interactions with atoms. Close to the atoms the changes are described as Fresnel diffraction; far away they are called Fraunhofer diffraction. The resulting map of the directions of the electrons far from the sample (Fraunhofer diffraction) is called a diffraction pattern, see for instance Figure 1. These patterns are similar to x-ray and neutron diffraction patterns, and are used to study the atomic structure of gases, liquids, surfaces and bulk solids.

Low-energy electron diffraction

Low-energy electron diffraction (LEED) is a technique for the determination of the surface structure of single-crystalline materials by bombardment with a collimated beam of low-energy electrons (30–200 eV) and observation of diffracted electrons as spots on a fluorescent screen. LEED may be used in one of two ways: Qualitatively, where the diffraction pattern is recorded and analysis of the spot positions gives information on the symmetry of the surface structure.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Related publications (3)

Photoemission Response of Bi2sr2cacu2ox - the Normal-State Anisotropy Is Intrinsic

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