Publication

Soft Probe Scanning Electrochemical Microscopy with Spider Array for Visualizing Biomarkers and Redox Active Proteins in Animal Tissues

Hubert Girault
2017
Conference Papers

Abstract

We present soft spider array for gentle contact mode scanning electrochemical microscopy (SECM) imaging of tissues. The spider array contains up to eight completely individual, parallel, and flexible carbon microelectrodes designed to scan square centimeter sized areas on reasonable time scales while avoiding sample aging and electrode fouling. The contact mode enables the scanning of largely curved samples at a constant distance. The spider array is applied for the SECM imaging of the distribution of certain biomarkers, such as tyrosinase, in thin tumor tissues as well as thick tumor blocks. Furthermore, the spider array can be applied for mapping the antioxidant distribution in an apple peel.

Official source

https://infoscience.epfl.ch/entities/publication/f081bd27-83c0-461f-bedf-eb5b1b98b764

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Hubert Girault
2017
Conference Papers

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/f081bd27-83c0-461f-bedf-eb5b1b98b764

About this result

Related concepts (30)

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Scanning tunneling microscope

A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1 nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated.

Related publications (2)

Soft Probe Scanning Electrochemical Microscopy with Spider Array for Visualizing Biomarkers and Redox Active Proteins in Animal Tissues

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Design of a variable-temperature scanning tunneling microscope to study reaction intermediates in heterogeneous catalysis

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