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A novel approach for the simulation of the field back-scattered from a rough surface is presented. It takes into account polarization and multiple scattering events on the surface, as well as diffraction effects. The validity and usefulness of this simulation is demonstrated in the case of surface topology measurement. (C) 2012 Optical Society of America
Denis Gillet, Juan Carlos Farah, Jérémy Alain La Scala-Jayet