Nanowire junctionless ISFET noise model in Verilog-A

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Nanowire junctionless ISFET noise model in Verilog-A

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Stencil-Based Selective Surface Functionalization of Silicon Nanowires in 3D Device Architectures for Next-Generation Biochemical Sensors

Fab-to-fab and run-to-run variability in 130 nm and 65 nm CMOS technologies exposed to ultra-high TID

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Abrupt switch based on internally combined Band-To-Band and Barrier Tunneling mechanisms

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