Publication

Well surface roughness and fault density effects on the Hall mobility of In[sub x]Ga[sub 1−x]As/In[sub y]Al[sub 1−y]As/InP high electron mobility transistors

Graph Chat

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Well surface roughness and fault density effects on the Hall mobility of In[sub x]Ga[sub 1−x]As/In[sub y]Al[sub 1−y]As/InP high electron mobility transistors

Chat with Graph Search

Sub-cellular quantitative optical diffraction tomography with digital holographic microscopy

Microstructural and electrical properties of (Sr,Ba)Nb2O6 thin films grown by pulsed laser deposition

Use of quantitative EELS and cathodoluminescence for study of carrier confinement and diffusion in self organized vertical quantum wells

Electronic and structural evidences for charge transfer and localization in iodine-doped pentacene

Modeling the photoluminescence lifetime in realistic quantum wires

High-quality AlInN for high index contrast Bragg mirrors lattice matched to GaN

1D and 2D X-ray waveguides: Optics and applications

Orienting tetracene and pentacene thin films onto friction-transferred poly(tetrafluoroethylene) substrate

Modeling and design of a low-voltage SOI suspended-gate MOSFET (SG- MOSFET) with a metal-over-gate architecture

Parallel unfolding and visualization of curved surfaces extracted from large three-dimensional volumes

Sol-gel derived Pb(Sc0.5Nb0.5)O-3 thin films: Processing and dielctric properties

Stationary magnetic entropy in ohmic tokamak plasmas: Experimental evidence from the TCV device