Publication

Antiferrodistortive Structural Phase Transition in Compressively-Strained Epitaxial SrTiO3 Film Grown on (La, Sr)(Al, Ta)O-3 Substrate

Nava Setter, Alexander Tagantsev
2010
Conference Papers

Abstract

(001)-epitaxial SrTiO3 films were grown on (La, Sr)(Al, Ta)O-3 substrates for investigating the impact of biaxial strain on the antiferrodistortive (AFD) structural phase transition in SrTiO3. The films were fully constrained by the substrates, which resulted in the large in-plane compressive strain of -0.9%. The AFD transition temperature estimated using temperature controlled x-ray diffraction and transmission electron microscope was over 150K higher than the theoretical prediction, but rather supported the experimental results reported on SrTiO3 films on LaAlO3 substrates.

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https://infoscience.epfl.ch/entities/publication/3d930e8e-0a14-4813-ab95-a3f7e61d59d0

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Nava Setter, Alexander Tagantsev
2010
Conference Papers

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/3d930e8e-0a14-4813-ab95-a3f7e61d59d0

About this result

Related concepts (19)

Strontium titanate

Strontium titanate is an oxide of strontium and titanium with the chemical formula SrTiO3. At room temperature, it is a centrosymmetric paraelectric material with a perovskite structure. At low temperatures it approaches a ferroelectric phase transition with a very large dielectric constant ~104 but remains paraelectric down to the lowest temperatures measured as a result of quantum fluctuations, making it a quantum paraelectric.

Stress–strain curve

In engineering and materials science, a stress–strain curve for a material gives the relationship between stress and strain. It is obtained by gradually applying load to a test coupon and measuring the deformation, from which the stress and strain can be determined (see tensile testing). These curves reveal many of the properties of a material, such as the Young's modulus, the yield strength and the ultimate tensile strength. Generally speaking, curves representing the relationship between stress and strain in any form of deformation can be regarded as stress–strain curves.

Transmission electron microscopy

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.

Related publications (2)

Antiferrodistortive Structural Phase Transition in Compressively-Strained Epitaxial SrTiO3 Film Grown on (La, Sr)(Al, Ta)O-3 Substrate

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