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The present invention concerns a method of sampling a test signal. The method comprises: acquiring (21) training signals sampled at a plurality of sampling locations; running (23) an optimization procedure for determining an index set of n indices, representing a subset of the sampling locations, that maximize a function, over the training signals, of a quality parameter representing how well a given training signal is represented by the n indices; and sampling (25) the test signal at the sampling locations represented by the n indices.
François Maréchal, Jonas Schnidrig, Arthur Antoine Chuat
Pascal Fua, Zhen Wei, Edouard Robert Albert Patrick Dufour, Colin Pelletier
Lenka Zdeborová, Emanuele Troiani, Giovanni Piccioli