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This work presents an analytical analysis of the thermal noise in widely used correlated double-sampling (CDS) circuits. The objective is to provide designers with simplified noise formulas essential for the design and optimization of such blocks. The obtained analytical results are confirmed with SpectreRF noise, SpectreRF transient noise and ELDO transient noise simulations.
Sabine Süsstrunk, Radhakrishna Achanta, Mahmut Sami Arpa, Martin Nicolas Everaert, Athanasios Fitsios