Publication

Chemical contrast observed at a III-V heterostructure by scanning near-field optical microscopy

Giorgio Margaritondo
1999
Journal Articles

Abstract

We observed chemical contrast with subwavelength resolution on a III-V heterostructure by a scanning near-field optical microscope (SNOM) working in the external reflection mode and coupled with a Free Electron Laser (FEL). SNOM reflectivity images revealed features that were not present in the corresponding shear-force (topology) images and are due to localized lateral changes in the optical properties of the sample. The data indicate an optical spatial resolution well below the diffraction limit of lambda/2 with most optical images having better lateral resolution than topographic images.

Official source

https://infoscience.epfl.ch/entities/publication/2f9291e3-ec6f-42ec-a117-dcf94b55c0ae

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chat

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Giorgio Margaritondo
1999
Journal Articles

Abstract

Official source

https://infoscience.epfl.ch/entities/publication/2f9291e3-ec6f-42ec-a117-dcf94b55c0ae

About this result

Related concepts (32)

Near-field scanning optical microscope

Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture.

Super-resolution microscopy

Super-resolution microscopy is a series of techniques in optical microscopy that allow such images to have resolutions higher than those imposed by the diffraction limit, which is due to the diffraction of light. Super-resolution imaging techniques rely on the near-field (photon-tunneling microscopy as well as those that use the Pendry Superlens and near field scanning optical microscopy) or on the far-field.

Optical microscope

The optical microscope, also referred to as a light microscope, is a type of microscope that commonly uses visible light and a system of lenses to generate magnified images of small objects. Optical microscopes are the oldest design of microscope and were possibly invented in their present compound form in the 17th century. Basic optical microscopes can be very simple, although many complex designs aim to improve resolution and sample contrast. The object is placed on a stage and may be directly viewed through one or two eyepieces on the microscope.

Related publications (32)

Chemical contrast observed at a III-V heterostructure by scanning near-field optical microscopy

Chat with Graph Search

Assessing the electric field sensitivity measured by pixelated differential phase contrast imaging in vacuum both in the absence of external fields and under field-bound conditions

Scanning probe microscope

Revisiting PSF models: theory and implementation