State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from thin film X-ray diffraction (GIWAXS, GISAXS, PDF), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and ...
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, s ...
This intensive course is intended for researchers who envisage using transmission electron microscopy to study materials samples or to help them interpret TEM data in publications. It presents basics of TEM instrumentation, imaging, electron diffraction, s ...
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their
research or who want to understand how to interpret SEM images and analytical results presented in scientific
publications. ...
This intensive course is intended for researchers who envisage to use scanning electron microscopy techniques for their
research or who want to understand how to interpret SEM images and analytical results presented in scientific
publications. ...
This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who h ...
This course introduces materials characterization techniques used by scientists and engineers. Lectures cover basic theory, applications, and limitations, while lab sessions offer hands-on experience, providing a well-rounded understanding of each method. ...