Nicolas Xanthopoulos

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Sol-gel processing parameters of Pb0.99Zr0.55Sn0.37Ti0.06Nb0.02O3 thin films were studied. Effects of H2O, HNO3 and formamide additives on solution gelation and film properties were investigated. Thin films were prepared on Ti/Pt and Ta/Pt metallized Si substrates. Film microstructures were characterized using SEM, TEM/EDS and XPS. Film microstructures typically contained 'rosette' structures. Strain response of the films under applied electric fields was measured using a double beam interferometer. A piezo

The nature and the role of 1 to 5 nm thick TiO2 seed layers for the growth of textured PbTiO3 and Pb(Zr, Ti)O-3 thin films on textured Pt(111) thin film substrates have been studied. Under otherwise identical in situ sputter deposition process conditions, the PbTiO3 texture could be turned from (100) to (111) orientation by adding the seed layer. This is demonstrated by patterning the TiO2 film. Auger electron spectroscopy and x-ray photoemission spectroscopy showed that the seed layer was a continuous TiO2

A series of TaOxNy photoelectrodes were deposited on F:SnO2 (FTO) substrates by DC reactive sputtering at room temperature, under a mixture of Ar, N-2 and O-2. The effects of the O-2 partial pressure during deposition (Po-2) on the films crystallinity, the ...

LaTiO2N photoanodes for solar water splitting were prepared by electrophoretic deposition and demonstrated the best photo-currents ever reported for this material. Further important enhancement of the performance was obtained by the use of a sputtered In2O ...

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging is employed to characterize the surface of patterned noble metal (Pt) and titania (TiO2) thin films deposited on oxidized silicon wafers. ToF-SIMS is used to follow the different process steps during the thin films patterning as well as the post-processing cleaning. Both positive and negative ToF-SIMS modes reveal the presence of contaminants, due to the etching processes (Cl- Al-,(+)), but only on the etched surfaces. Elements due to the pos

The texture of sputter deposited PbTiO3 films could be turned from (100)- to (111)-orientation by adding a few nm thick TiO2 layer onto the textured Pt(111) substrate film. AES, XPS, and XPD measurements showed that such TiO2 films were epitaxially ordered and covered the whole surface of Pt. Various deposition experiments indicated that the TiO2 is effective only when it is ordered before the PbTiO3 nucleation starts. Otherwise, the (100) self texture dominates.

Nicolas Xanthopoulos

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Sol-gel processing of PNZST thin films on Ti/Pt and Ta/Pt metallizations

Texture control of PbTiO3 and Pb(Zr,Ti)O-3 thin films with TiO2 seeding

TaOxNy Sputtered Photoanodes For Solar Water Splitting

LaTiO2N/In2O3 photoanodes with improved performance for solar water splitting

Imaging by time-of-flight secondary ion mass spectrometry of plasma patterned metal and oxide thin films

In-situ sputter deposition of PbTiO3 thin films: nucleation on textured platinum films

Chemical nature of colossal dielectric constant of CaCu3Ti4O12 thin film by pulsed laser deposition

Pt particles supported on conducting polymeric nanocones as electro-catalysts for methanol oxidation