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Lecture
Metrology Practicals: Introduction
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Related lectures (32)
Electron Microscope Components
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Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Electron Microscopy: In Situ
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Explores electron microscopy in situ, covering time-resolved techniques and environmental TEM applications for SOFC.
Scanning Electron Microscopy
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Explores Scanning Electron Microscopy principles, signal contrasts, resolution factors, and sample interactions.
Electron Microscopy: In Situ
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Explores electron microscopy in situ, including time-resolved techniques and environmental TEM applications.
Electron Microscopy Components
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Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.
Microscopy in situ and TEM Q&A
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Explores in situ electron microscopy applications, traction experiments, environmental effects, XRD, and EDS.
Dose Management in Electron Microscopy
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Explores the challenges and solutions for managing electron dose in microscopy, emphasizing the importance of accurate dose tracking and analysis.
Transmission Electron Microscopy
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Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Transmission Electron Microscopy: Operation and Imaging
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Explores the operation and imaging techniques of Transmission Electron Microscopy (TEM), including service mode setup and digital micrograph usage.
Introduction and Interaction with Radiation-Matter
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Introduces electron microscopy, covering practical organization, sample preparation, radiation-matter interaction, and detector mechanisms.
Electron Microscopy: EDS and ESEM
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Explores EDS and ESEM principles, x-ray detection, ionization efficiency, Moseley's law, and ESEM sample environments.
Microscopy: General Aspects and Techniques
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Covers general aspects and techniques of microscopy, emphasizing resolution importance and exploring scanning tunneling and atomic force microscopy.
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