Explores applications of micron and submicron focusing, crystallography, and tomographic reconstructions in beamlines, as well as the need for secondary optics and different types of lenses.
Explores radiation sources, including fast electron sources, heavy charged particle sources, and neutron sources, covering processes like beta decay, internal conversion, and Auger electrons.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
