Covers the 2x2 transfer matrix for optical systems and the characterization using height and angle parameters, along with lens systems and entrance pupils.
Covers the basics of image acquisition, including optical devices, resolution factors, lens distortions, and sensor technologies.
Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
Explores imaging modes in TEM, covering electron-matter interactions, diffraction patterns, image formation, contrast principles, and detector configurations.
