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Lecture

Nanomagnetic Imaging Techniques

In course

MSE-670: Advanced Microscopy for Magnetic Materials

Theoretical and practical expertise is gained about the microscopy of spin structures and magnetic configuiations down to the sub-nm length and sub-ns time scales such as transmission electron microscopy, x-ray and light scattering, magnetic dichroism, and ...

Description

This lecture covers advanced nanomagnetic imaging techniques such as magneto-optical imaging, Lorentz microscopy, SQUID microscopy, and scanning probe microscopy for studying phenomena like skyrmion crystals, edge currents, 2D materials, and correlated states in atomically layered materials.

Instructors (4)

Birth 20/04/1976 Master degree: University of Pavia "optoelectronic engineering". September 2001. Reasearch scientist at Pirelli Labs, Milan Italy between September 2000 and August 2002. PhD in condensed matter physics from the University of Geneva, prof. van der Marel gorup. January 2007 Post doc in physical chemistry at Caltech in prof. Zewail`s group. March 2007-April 2009

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Related concepts (32)

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Noise (electronics)

In electronics, noise is an unwanted disturbance in an electrical signal. Noise generated by electronic devices varies greatly as it is produced by several different effects. In particular, noise is inherent in physics and central to thermodynamics. Any conductor with electrical resistance will generate thermal noise inherently. The final elimination of thermal noise in electronics can only be achieved cryogenically, and even then quantum noise would remain inherent. Electronic noise is a common component of noise in signal processing.

Noise reduction

Noise reduction is the process of removing noise from a signal. Noise reduction techniques exist for audio and images. Noise reduction algorithms may distort the signal to some degree. Noise rejection is the ability of a circuit to isolate an undesired signal component from the desired signal component, as with common-mode rejection ratio. All signal processing devices, both analog and digital, have traits that make them susceptible to noise.

Shot noise

Shot noise or Poisson noise is a type of noise which can be modeled by a Poisson process. In electronics shot noise originates from the discrete nature of electric charge. Shot noise also occurs in photon counting in optical devices, where shot noise is associated with the particle nature of light. In a statistical experiment such as tossing a fair coin and counting the occurrences of heads and tails, the numbers of heads and tails after many throws will differ by only a tiny percentage, while after only a few throws outcomes with a significant excess of heads over tails or vice versa are common; if an experiment with a few throws is repeated over and over, the outcomes will fluctuate a lot.

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