Explores Fresnel diffraction, Fraunhofer diffraction, the Babinet principle, and optical microscope resolution, as well as near-field microscopy and SNOM/NSOM imaging.
Explores dynamical scattering in electron diffraction, discussing challenges in interpreting diffraction patterns and applications in crystal defect imaging and phase discrimination.
Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.