Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
Introduces Electron Backscatter Diffraction (EBSD) in the SEM for microstructural analysis of various materials, emphasizing sample preparation and pattern indexation.
Explores the application of Maxwell's equations to antennas, covering radiation, Poynting vector, potentials, source currents, diffraction, and wave polarization.
Explores small oscillations, equilibrium points, harmonic oscillators, and gravitational fields in physics, including historical perspectives on celestial movements.