Explores dynamical scattering in electron diffraction, discussing challenges in interpreting diffraction patterns and applications in crystal defect imaging and phase discrimination.
Explores Fresnel diffraction, Fraunhofer diffraction, the Babinet principle, and optical microscope resolution, as well as near-field microscopy and SNOM/NSOM imaging.
Analyzes interference patterns from a device with six slits to determine the relation between slit width and distance, showcasing mathematical expressions and graphical representations.
