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This lecture covers the basics and goals of Surface X-ray Diffraction (SXRD), focusing on the study of crystalline surfaces and interfaces, including the Si(111) 7x7 reconstruction. It explains how to determine the structure of surfaces or interfaces using scattering methods, particularly Crystal Truncation Rods (CTRs). The lecture also delves into the experimental stability of SXRD, the convolution theory behind CTRs, and why CTRs are not always visible due to surface flatness. It concludes with the recording of SXRD data, emphasizing the importance of understanding CTRs for surface-sensitive analysis.