Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.
Explores self-sensing cantilevers in Scanning Probe Microscopy and the advantages of integrated sensor-actuator systems for high-speed data collection.
Explores 3D Microscopy and Tomography techniques, including Atom Probe Tomography and Field Emission Microscopy, emphasizing electron tomography principles and applications.
Covers high-resolution transmission electron microscopy imaging techniques, focusing on phase contrast, simulations, and the impact of aberrations on image interpretation.
Celebrates Philippe Renaud's exceptional journey in microengineering, innovation, and education, showcasing his impact on research, education, and interdisciplinary collaborations.