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PHYS-405: Experimental methods in physics

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Lectures in this course (31)

Electron Microscopy: Components and Operation

Explores the history and operation of electron microscopes, focusing on components and resolving power.

Scanning Electron Microscopy: Signals and Detectors

Covers the principles of Scanning Electron Microscopy, including SEM signals, detectors, and energy spectrum of electrons, as well as the efficiency of X-ray generation.

Scanning Probe Microscopy: Techniques and Applications

Covers the principles and applications of Scanning Probe Microscopy, including quantum tunneling and high-resolution imaging.

Atomic Force Microscopy: Tip-Sample Interactions

Explores tip-sample interactions in AFM, covering hysteresis, contact and non-contact modes, feedback mechanisms, and image resolution.

Surface Analysis: SIMS Examples

Explores surface analysis examples using SIMS, covering segregation, cleaning, and depth profiling of materials.

Scanning Probe Microscopy: Fundamentals

Covers the fundamentals of Scanning Probe Microscopy, including its history, principles, instruments, and applications in semiconductor research and industry.

Noise in Data Acquisition

Explores noise sources in data acquisition, including thermal, shot, and amplifier noise, as well as the effects of ADC noise.

Piezo Scanner and STM

Explores piezo scanners, STM feedback, and challenges in achieving nanometer resolution for high-quality imaging.

Interference Sources

Explores noise interference sources in electronic systems, covering thermal, magnetic, and electromagnetic fields, ground loops, and common resistance paths.

Non-contact AFM: Operation and Applications

Explores non-contact AFM operation, cantilever resonance, force regimes, image processing, and advanced SPM modes.

Noise Reduction Techniques

Explores various noise reduction techniques, including impedance matching, temperature reduction, and bandwidth reduction.

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