Course

PHYS-405: Experimental methods in physics

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Lectures in this course (31)

Energy Dispersive X-ray Spectroscopy

Covers the principles and applications of Energy Dispersive X-ray Spectroscopy (EDX) in elemental analysis and quantification methods in SEM.

Tomography: Imaging by Sections

Covers the principles and applications of tomography in various fields, focusing on imaging by sections and different reconstruction techniques.

High Resolution He Ion Microscopy

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

Surface Analysis: SIMS Examples

Explores surface analysis examples using SIMS, covering segregation, cleaning, and depth profiling of materials.

Scanning Probe Microscopy: Fundamentals

Covers the fundamentals of Scanning Probe Microscopy, including its history, principles, instruments, and applications in semiconductor research and industry.

Noise in Data Acquisition

Explores noise sources in data acquisition, including thermal, shot, and amplifier noise, as well as the effects of ADC noise.

Piezo Scanner and STM

Explores piezo scanners, STM feedback, and challenges in achieving nanometer resolution for high-quality imaging.

Interference Sources

Explores noise interference sources in electronic systems, covering thermal, magnetic, and electromagnetic fields, ground loops, and common resistance paths.

Non-contact AFM: Operation and Applications

Explores non-contact AFM operation, cantilever resonance, force regimes, image processing, and advanced SPM modes.

Noise Reduction Techniques

Explores various noise reduction techniques, including impedance matching, temperature reduction, and bandwidth reduction.

Pulse Techniques: Noise Reduction

Explores pulse techniques for signal measurements and noise reduction methods like gated integration and boxcar averaging.

TEM imaging with diffraction contrast

Covers the basics of electron diffraction, diffraction theory, image formation, and X-ray diffraction techniques.

Scanning Probe Microscopy

Explores the principles and applications of Scanning Probe Microscopy techniques.

Reducing Interference: Shielding and Grounding

Explores reducing interference through shielding, grounding, and differential measurement, emphasizing the importance of proper amplification and interference reduction techniques.

STEM & EDX: Electron Microscopy Principles

Covers electron microscopy principles, detectors, and contrast mechanisms.

Aberration Correction in HRTEM

Explains the principles of HRTEM, including contrast transfer, lenses, and aberration correction.

Tomography: Principles and Applications

Explores the principles and applications of tomography, covering X-ray computed tomography, electron tomography, and advanced techniques.

Tomography: Principles and Applications

Explores the principles and applications of tomography, showcasing examples of direct tomography and advanced imaging techniques.

HRTEM: Image Formation

Explores HRTEM image formation through interference of transmitted and diffracted beams, covering contrast transfer function, aberration correction, and phase retrieval techniques.

Surface Analysis and SIMS

Explores surface analysis methods using electrons, ions, atoms, and photons, emphasizing the importance of ToF-SIMS for in-depth surface analysis in various fields.