Course

CH-632: Principles and Applications of X-ray Diffraction

Summary

Basic theoretical aspects of Crystallography and the interaction between X-ray radiation and matter. Experimental aspects of materials-oriented powder and single crystal diffraction. Familiarization with modern X-ray diffractometers.

Lectures

Instructors (2)

Farzaneh Fadaei Tirani

Teaching & PhD Courses Principles and Applications of X-ray Diffraction CH-632 Basic theoretical aspects of Crystallography and the interaction between X-ray radiation and matter. Experimental aspects of materials-oriented powder and single crystal diffraction. Familiarization with modern X-ray diffractometers.

Pascal Alexander Schouwink

Teaching & PhD Courses Advanced Solid State and Surface Characterization CH-633 State-of-the-art surface/thin film characterization methods of polycrystalline/nano/amorphous materials. Selected topics from X-ray scattering (SAXS/GISAXS, PDF, GIWAXS, HRXRD), electronic and optical spectroscopy (XPS, AES, SERS, TERS), scanning probe and electron microscopy (STM, AFM, HRTEM, SEM). Principles and Applications of X-ray Diffraction CH-632 Basic theoretical aspects of Crystallograph

Official source

https://edu.epfl.ch/coursebook/en/principles-and-applications-of-x-ray-diffraction-CH-632

Moodle Page

http://go.epfl.ch/CH-632

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Summary

Lectures

Instructors (2)

Farzaneh Fadaei Tirani

Pascal Alexander Schouwink

Official source

https://edu.epfl.ch/coursebook/en/principles-and-applications-of-x-ray-diffraction-CH-632

Moodle Page

http://go.epfl.ch/CH-632

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