Nicolas GrandjeanNicolas Grandjean received a PhD degree in physics from the University ofNice Sophia Antipolis in 1994 and shortly thereafter joined the French National Center for Scientific Research (CNRS) as a permanent staff member. In 2004, he was appointed tenure-track assistant professor at the École polytechnique fédérale de Lausanne (EPFL) where he created the Laboratory for advanced semiconductors for photonics and electronics. He was promoted to full professor in 2009. He was the director of the Institute of Condensed Matter Physics from 2012 to 2016 and then moved to the University of California at Santa Barbara where he spent 6 months as a visiting professor. Since 2018, he is the head of the School of Physics at the EPFL. He was awarded the Sandoz Family Foundation Grant for Academic Promotion, received the “Nakamura Lecturer” Award in 2010, the "Quantum Devices Award” at the 2017 Compound Semiconductor Week, and “2016 best teacher” award from the EPFL Physics School. His research interests are focused on the physics of nanostructures and III-V nitride semiconductor quantum photonics.
Philippe BuffatBorn in Lausanne (Switzerland) in 1942. EPUL physics engineer diploma in 1967 and EPFL PhD in physics in 1976. From 1966 he studies at the Experimental Physics Laboratory (Prof. J.P. Borel) the physical properties peculiar to the very small size metal crystals and gets a PhD degree for his thesis "Abaissement de la température de fusion de petits cristaux d'or par effet de taille thermodynamique" (Lowering of the melting temperature of small gold crystals by thermodynamic size effect). In 1971, he starts to develop an electron microscopy facility available to all EPFL students and researchers (nowadays Centre Interdisciplinaire de Microscopie Electronique CIME) that he manages till 2007. In parallel he teaches the principles of electron microscopy and the Experimental methods of physics at the Physics/Basic Sciences School (SB). In addition, he trains a large part of the facility users. Honorary professor BS/EPFL he carries-out a free-lance research at CIME and in collaboration with the Institute of Crystallography of the Russian Academy of Sciences (ICRAS, Moscow) and the International Centre of Electron Microscopy for Material Science (IC-EM AGH Krakow) This activity covers all the techniques related to transmission and scanning electron microscopy applied to materials science and solid-state physics. His interest is directed towards the structure of nanocrystals, their size effects and behavior under strong electron irradiation, the phase transitions in perovskites, the characterization of nanophases, multilayer and interface structures of crystalline materials and bioceramics. More recently a large research part has moved to understanding/pointing-out the adequacy between the limits of the instruments and their interpretation means in regard of their use in a multiusers facility with a large turnover and a wide range of materials/structures. He is past-president (2006-2007) of the Société Française des Microscopies (Sfµ), honorary member of the Sfµ and of the Swiss Society of Optics and Microscopy (SSOM).
Wen Hua BiExpertise
X-Ray Crystallography, Software Evaluation
Marcel DrabbelsDr. Marcel Drabbels studied experimental physics at the University of Nijmegen (the Netherlands) and in 1993 obtained his Ph.D. at that same university. He then moved to the University of California at Santa Barbara where he studied the dynamics of highly vibrationally excited molecules and developed a new detection technique to investigate the photodissociation of molecules. When he returned to the Netherlands in 1996 he joined the FOM Institute for Atomic and Molecular Physics in Amsterdam where he worked on the development of new types of infrared imaging and streak cameras. In 1997 Dr. Drabbels was awarded a fellowship of the Royal Dutch Academy of Sciences and he moved to the Free University of Amsterdam where he studied the collision dynamics of molecules and initiated photodissociation experiments using ultrafast lasers. In October 1998 he was appointed as senior scientist at the EPFL where he studies the spectroscopy and dynamics of nanoscale systems. In March 2021 he was promoted to titular professor.
Jean-Michel SalleseExpertise
- Modeling of field effect transistors (Multigate FETs, Junctionless FET, HEMT, Field Effect-based Biosensors).- Modeling substrate parasitic currents in integrated circuits.- Simulation of radiation induced soft errors in integrated circuits- High energy particle solid-state sensors.
Mission
The mission of the Electron Device Modeling and Technology group is to develop analytical and numerical models (physics based) of emerging semiconductor devices, with particular emphasis on field effect trans
Arnaud MagrezEducation
PhD., Materials Science, summa cum laude, Université de Nantes, 2002
M.S., Chemistry, Université des Sciences et Technologies de Lille, 1999
Academic positions
Head of the Crystal Growth Facility, EPFL, 2012-present
Research Associate, Laboratoire de Physique de la Matière Complexe, EPFL, 2003-2012
Research Fellow, Peter Grunberg Institute, FZ-Juelich, 2002-2003
Administrative positions at EPFL
Scientific staff member, EPFL Assembly, 2015-present
Scientific staff member, School Council SB, 2014-present
Member of the IPHYS office 2016-present
Member of the ICMP office 2012-2015
Member of the safety committee of ICMP 2010-2015
David Fernando Reyes VasquezExpertise
Electron energy loss spectroscopy (EELS)Aberration-corrected TEM and STEM
Teaching & PhD Courses Scanning and Analytical Transmission Electron Microscopy MSE-735 This intensive course discusses advanced TEM techniques such as: scanning TEM; analytical TEM using EELS and EDX; aberration corrected imaging; and image simulation. It is intended for researchers who have taken the introductory TEM course MSE-637 or who have a good background in conventional TEM.
Thomas La GrangeExpertise
Electron Microscopy, Aberration Correct Scanning Transmission Electron Microscopy, Electron Diffraction, Ultrafast Transmission Electron Microscopy, Electron Energy Loss Spectroscopy, Energy Dispersive Spectroscopy, Materials Science, High-speed deformation, Dislocation Dynamics, Skyrmionics, Martensitic Phase Transformation Theory, Solidification
Expertise
Electron Microscopy, Aberration Correct Scanning Transmission Electron Microscopy, Electron Diffraction, Ultrafast Transmission Electron Micro
