Design and characterisation of low-cost thick-film piezoresistive force sensors for the 100 mN to 100 N range

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Employing polymer cantilevers has shown to outperform using their silicon or silicon nitride analogues concerning the imaging speed of atomic force microscopy (AFM) in tapping mode (intermittent contact mode with amplitude modulation) by up to one order of ...

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The success of high-speed atomic force microscopy in imaging molecular motors1, enzymes2 and microbes3 in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic ...

CMOS Image Sensors (CIS) overtook the charge coupled devices (CCDs) in low noise performance. Photoelectron counting capability is the next step for CIS for ultimate low light performance and new imaging paradigms. This work presents a review of CMOS image ...

Optical beam deflection (OBD) is the most prevalent method for measuring cantilever deflections in atomic force microscopy (AFM), mainly due to its excellent noise performance. In contrast, piezoresistive strain-sensing techniques provide benefits over OBD ...

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An existing hybrid-GFRP/steel joint for load transfer and thermal insulation in concrete slab structures was developed into an all-GFRP joint. The new joint consists of a pultruded GFRP tensile/shear element anchored through adhesively bonded ribs in the c ...

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An innovative release method of polymer cantilevers with embedded integrated metal electrodes is presented. The fabrication is based on the lithographic patterning of the electrode layout on a wafer surface, covered by two layers of SU-8 polymer: a 10-um-t ...

The purpose of this paper is to demonstrate sensors and structures fabricated using the LTCC technology, which has been addressed and employed increasingly as a smart packaging approach for several applications. The focus will be on inclination and cantile ...

The general idea of Nanotechnology is not new – it has been studied since Nobel laureate Richard Feynman outlined the idea in a speech in 1959 – but it's only recently that the progress carried out in the various fields of material, optic, physic and engin ...

Vertical Hall sensors are capable of measuring surface-parallel components of the magnetic field. They allow therefore relatively easy conception of single-chip multi-axial magnetic sensors compared to solutions using horizontal Hall plates. The modern tre ...

Design and characterisation of low-cost thick-film piezoresistive force sensors for the 100 mN to 100 N range

Chattez avec Graph Search

Integration of sharp silicon nitride tips into high-speed SU8 cantilevers in a batch fabrication process

An Analytical Model for Beam Flexure Modules Based on Timoshenko Beam Theory

Harnessing the damping properties of materials for high-speed atomic force microscopy

Ultra Low Noise CMOS Image Sensors

Piezoresistive AFM cantilevers surpassing standard optical beam deflection in low noise topography imaging

Micro and nano tools for magnetic field imaging

Multifunctional all-GFRP joint for concrete slab structures

Multifunctional hybrid GFRP/steel joint for concrete slab structures

Polymer-based cantilevers with integrated electrodes

Structuration and Fabrication of Sensors Based on LTCC (Low Temperature Co-fired Ceramic) Technology

Massively parallel AFM with digital holographic readout

Highly sensitive vertical hall sensors in CMOS technology