We present DARKFLUX, a software tool designed to analyze indirect-detection signatures for next-generation models of dark matter (DM) with multiple annihilation channels. Version 1.0 of this tool accepts user-generated models with 2 -> 2 tree-level dark matter annihilation to pairs of Standard Model (SM) particles and analyzes DM annihilation to gamma rays. The tool consists of three modules, which can be run in a loop in order to scan over DM mass if desired:
Rakesh Chawla, Andrea Rizzi, Matthias Finger, Federica Legger, Matteo Galli, Sun Hee Kim, João Miguel das Neves Duarte, Tagir Aushev, Hua Zhang, Alexis Kalogeropoulos, Yixing Chen, Tian Cheng, Ioannis Papadopoulos, Gabriele Grosso, Valérie Scheurer, Meng Xiao, Qian Wang, Michele Bianco, Varun Sharma, Joao Varela, Sourav Sen, Ashish Sharma, Seungkyu Ha, David Vannerom, Csaba Hajdu, Sanjeev Kumar, Sebastiana Gianì, Kun Shi, Abhisek Datta, Siyuan Wang, Anton Petrov, Jian Wang, Yi Zhang, Muhammad Ansar Iqbal, Yong Yang, Xin Sun, Muhammad Ahmad, Donghyun Kim, Matthias Wolf, Anna Mascellani, Paolo Ronchese, , , , , , , , , , , , , , , , , , , , ,