Positive exchange bias in thin film multilayers produced with nano-oxide layer

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Thermochromic GexV1-xO2+y thin films have been deposited on Si (100) substrates by means of reactive magnetron sputtering. The films were then characterized by Rutherford backscattering spectrometry (RBS), four-point probe electrical resistivity measuremen ...

Positive exchange bias in thin film multilayers produced with nano-oxide layer

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