Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density

An assessment of the fault-tolerance properties of single-ended and differential signaling is shown in the context of a high defect density environment, using a robust error-absorbing circuit architecture. A software tool based on Monte-Carlo simulations is used for the reliability analysis of the examined logic families. A benefit of the differential circuit over standard single-ended is shown in case of complex systems. Moreover, analysis of reliability of different circuits and discussion on the optimal granularity of redundant blocks was made.